Low-contrast areas of the brain sharpen and general image quality improves (center image) with GE’s algorithmic sleight of hand, called Adaptive Statistical Iterative Reconstruction. Scans performed at Mount Sinai Medical Center in New York City on GE’s Discovery CT750HD benefit from statistical noise profiles that ramp up image clarity and suppress noise. The result is up to a 30% increase in low-contrast detectability at reduced x-ray dose. The advanced reconstruction technique was initially built for the company’s high-end Discovery CT750HD, which was released commercially in 2008. It has since migrated to the LightSpeed VCT XTe, a premium configuration of the company’s 64-slice LightSpeed VCT. (Provided by Dr. Lawrence N. Tanenbaum, Mount Sinai School of Medicine, New York City)
