JFR 2008 puts emphasis on high-tech imaging

December 1, 2008

High-tech imaging was the central theme of the 56th Journées Françaises de Radiologie (JFR), held in Paris from 24 to 28 October. Left: DI Europe's editorial advisor, Prof. Andy Adam from London, was one of three honorary members at the congress.

High-tech imaging was the central theme of the 56th Journées Françaises de Radiologie (JFR), held in Paris from 24 to 28 October. Left: DI Europe's editorial advisor, Prof. Andy Adam from London, was one of three honorary members at the congress. The other two honorary members were Prof. Lluís Donoso Bach from Barcelona and Dr. James Thrall from Boston, Massachusetts. Middle: The general assembly of the Fédération Nationale des Médecins Radiologues took place during the JFR. FNMR president Dr. Jacques Niney informed attendees about the ongoing reforms and reductions in fees that might lie ahead. Right: The Société Française de Radiologie's reception took place at the Hôtel des Invalides. (Photos by Dr. Robert Lavayssière)